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  • Semiconductor Tester
  • Camera Module Test Device
  • High Speed Smart Network Card

    CIS Tester

    C-PHY and D-PHY Compatible High Performance Series

  • CZC800                 High-performance CIS Tester

    CZC800 High-performance CIS Tester

    High-performance CIS Tester

    Hybrid CIS Tester

       MIPI C-PHY 4.0Gsps/Trio


    Support 1792 channel pattern test


    Integrated design of image capture, electrical characteristic test and pattern test



  • Integrated CIS Tester

    Integrated CIS Tester

    Integrated CIS Tester

    Integrated CIS Tester

    The first integrated high-performance CIS tester in China that can support "high-speed image capture + precise electrical characteristic detection + pattern test" at the same time

  • Docking solution CIS Tester

    Docking solution CIS Tester

    Docking solution CIS Tester

    Docking solution CIS Tester

    32-site Docking connects to CIS Tester


    MIPI C-PHY and D-PHY compatible


    Integrated design of image capture and electrical characteristics



  • Cable solution CIS Tester

    Cable solution CIS Tester

    Cable solution CIS Tester

    Cable solution CIS Tester

    16-site Cable connects to CIS tester


    MIPI C-PHY and D-PHY compatible


    Integrated design of image capture and electrical characteristics

    Digital Tester

    Multichannel, High Concurrent Measurement, Multifunctional Digital Tester

  • Small digital Tester CZD800L series

    Small digital Tester CZD800L series

    Small digital Tester CZD800L serie

    Small digital Tester CZD800L series

    The main frequency is 200M


    Storage depth 128M lines


    Up to 384 IO channels are available


  • 200M Digital Tester CZD800 series

    200M Digital Tester CZD800 series

    200M Digital Tester CZD800 series

    200M Digital Tester CZD800 series

    The main frequency is 200M


    Storage depth 128M lines


    Up to 1024 IO channels can be equipped


  • 400M Digital Tester CZD800H Series

    400M Digital Tester CZD800H Series

    400M Digital Tester CZD800H

    400M Digital Tester CZD800H

    The main frequency is 400M


    Storage depth 512M lines


    Up to 1792 IO channels can be equipped


  • 800M Digital Tester CZ98000 Series (Under Development)

    800M Digital Tester CZ98000 Series (Under Development)

    800M Digital Tester CZ98000

    800M Digital Tester CZ98000

    The main frequency is 800M


    Storage depth 512M lines


    Up to 4096 IO channels can be equipped


    ATE Software Development & Services

    Make program development faster and production testing more efficient

  • MetaATE Software System

    MetaATE Software System

    CZTEK semiconductor ATE software system

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