Digital chip test system solutions

Covering the whole process of digital chip testing, it provides innovative solutions for all aspects of testing

  • SoC chip CP/FT detection

    SoC chip CP/FT detection

    Chenzhuo Technology series digital tester solution can be used for mainstream SoC chip digital test, the solution has the following advantages:

    ● High measurement: the number of channels is large, the stand-alone machine can be equipped with 1024IO, support 256-site simultaneous testing, and the typical configuration is 1024/768/512/384 channels

    ● Large storage depth: the storage depth of digital Pattern can reach 128M per line;

    ● Strong DC capability: the digital test board integrates PPMU, BPMU and BDPS functions, supports independent Force, Sense pins, supports high-current output and high-precision measurement;

    ● Perfect function: provide test program, pattern format converter; Provide Cable, Doking, Pogo Tower a variety of test interface solutions; Support common peripheral interface protocols, provide flashing and configuration functions.

  • Usage scenario: CP test

    ● Industry-leading digital channel number, test frequency, and storage depth;

    ● Easy to expand, the board can be expanded according to test needs, and the maximum can achieve up to 256-site simultaneous testing;

    ● High voltage, high current driving ability and high-precision voltage and current measurement ability;

    ● Support Cable, Doking, Pogo Tower multiple interfaces to meet a variety of chip testing needs nComes with a main control, which can quickly adapt to various Prober machines.


    Usage scenario: CP test
  • Usage scenario: FT test

    Usage scenario: FT test

    ● Lightweight digital testing machine, industry-leading test frequency and storage depth, can provide cost-effective solutions for digital chip FT testing;

    ● High voltage, high current driving ability and high-precision voltage and current measurement ability;

    ● Support multiple interfaces of Cable and Docking to meet a variety of chip testing needs;

    ● Comes with main control, can quickly adapt to various handler machines.